"Determination of the relative amount of fluorine in uranium oxyfluoride particles using secondary ion mass spectrometry and optical spectroscopy," R. Kips, M. J. Kristo, I. D. Hutcheon, K. B. Olsen, J. Amonette, Z. Wang, D. Gerlach, T. Johnson, Proceedings of the Fiftieth Annual Meeting of the Institute for Nuclear Materials Management, July 12-16, 2009, Tucson, Arizona, USA.
"Investigation of the Chemical Changes in Uranium Oxyfluoride Particles," R. Kips and M. J. Kristo, Presented at the Forty-second Western Regional Meeting of the American Chemical Society, September 23-27, 2008, Las Vegas, Nevada, USA.
"Discrimination of source reactor type by multivariate statistical analysis of uranium and plutonium isotopic concentrations in unknown irradiated nuclear fuel material," M. Robel and M. J. Kristo, Journal of Environmental Radioactivity 99 (2008), 1789.
"Imaging and 3D Elemental Characterization of Intact Bacterial Spores by High-Resolution Secondary Ion Mass Spectrometry," S. Ghosal, S. J. Fallon, T. J. Leighton; K. E. Wheeler, M. J. Kristo, I. D. Hutcheon, and P. K. Weber, Anal. Chem., 80 (2008) 5986.
"Documentation of a model action plan to deter illicit nuclear trafficking," D. K. Smith, M. J. Kristo, S. Niemeyer, and G. B. Dudder, J. Radioanalytical & Nuclear Chem., 276 (2008), 415.
"U.S. and Russian Collaboration in the Area of Nuclear Forensics," paper published in "The Future of the Nuclear Security Environment in 2015," proceedings of the international workshop sponsored by the U.S. National Academy of Sciences and the Russian Academy of Sciences, November 12-13, 2007.
"Nuclear Forensics Support," IAEA Nuclear Security Series No. 2, International Atomic Energy Agency, Vienna, 2006.
"Troubleshooting Problems Using Surface and Microanalytical Techniques," M. J. Kristo,
American Biotechnology Laboratory, August 2001, Vol. 19, No. 9., pp.64-66.
"Troubleshooting Problems Using Surface and Microanalysis," M. J. Kristo, Medical Device Coatings and Surface Treatments, April 5, 2000. Medical Device Coatings and Surface Treatments, April 6, 2001.
"Reliable Peak-Finding for MS/MS," Michael J. Kristo and Christie G. Enke, Int. J. Mass Spectrom. Ion Processes, 87 (1989) 141.
"System for simultaneous count/current measurement with a dual-mode photon/particle detector," Michael J. Kristo and Christie G. Enke, Rev. Sci. Instrum. 59 (1988) 438.
"Ion-trapping Technique for Ion/Molecule Reaction Studies in the Center Quadrupole of a Triple Quadrupole Mass Spectrometer," G. G. Dolnikowski, M. J. Kristo, C. G. Enke, and J. T. Watson, Int. J. Mass Spectrom. Ion Processes, 82 (1988), 1.
"A Versatile Software Control System for a Triple Quadrupole Mass Spectrometer," C. A. Myerholtz, A. J. Schubert, M. J. Kristo, and C. G. Enke, Instruments and Computers, 3, 11 (1985).
"FORTH for a Multimicroprocessor Control System," C. A. Myerholtz, A. J. Schubert, M. J. Kristo, and C. G. Enke, Instruments and Computers, 3, 13 (1985).